Scanning electron microscopy of polished, slightly etched surface of Silurian Limestones from Gotland: A method to observe acritarch in situ. (In: Commision Internationale de microflore du Paleozoique (CIMP) Acritarch Subcommision: O.Fatka and T.Servais, editors)
Reference:
Munnecke,A. et al. (1996)
Scanning electron microscopy of polished, slightly etched surface of Silurian Limestones from Gotland: A method to observe acritarch in situ. (In: Commision Internationale de microflore du Paleozoique (CIMP) Acritarch Subcommision: O.Fatka and T.Servais, editors) Acta Universitatis Carolinae-Geologica
Vol. 40 # 3 P. 549- 553